APD05C1 is a bottom illuminated, highly sensitive avalanche photodiode (APD) chip with an integrated backside lens. This linear mode APD is optimized for long wavelength, eye safe LiDAR applications and comes with low dark current and low excess noise. Thanks to the low device capacitance, the APD can be operated in pulsed time-of-flight (TOF) systems as well as offers the required bandwidth and linearity to pursue formats such as frequency modulated continuous wave (FMCW).
The APD operates in the wavelength range from 990 nm up to 1650 nm and has an exceptionally high responsivity of 1.1 A/W. The backside substrate acts as an integrated sunlight filter, absorbing parasitic signals in the visible spectrum without increasing noise.
The integrated backside lens focuses the incoming photons on the topside detecting area enabling higher fill factor and coupling efficiency. The chip has a flexible contact pad layout allowing both wire-bonding and flip-chip mounting in different configurations
- Operating from 990 nm to 1650 nm
- Large lens diameter of 100 µm increasing fill factor
- High responsivity: 1.1 A/W
- Low operating bias: 27 V
- Low temperature dependence: 25 mV/°C
- Flexible pad configuration with support pads for flip-chip bonding